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The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

Factor the polynomial 4x4 – 20x2 – 3x2 + 15 by grouping. what is the resulting expression? (4x2 + 3)(x2 – 5) (4x2 – 3)(x2 – 5) (4x2 – 5)(x2 + 3) (4x2 + 5)(x2 – 3)

Find the area of the surface obtained by rotating the curve z=4e^2y from y = 0 to y =1 about the y-axis. the area is square units