Consider the diagram. Planes M and N intersect at line d. Lines a, b, and e are on plane M. Line a is vertical and forms a right angle with line d. Line b is diagonal and goes up and to the right. Line e is at the top of the plane and is close to being horizontal. Line c is on plane N and goes slightly up and to the right.

Lines a and d are

non-coplanar.
parallel.
perpendicular.
skew.

The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to