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Assume a 15 cm diameter wafer has a cost of 12, contains 84 dies, and has 0.020 defects/cm2

assume a 20 cm diameter wafer has a cost of 15, contains 100 dies, and has 0.031 defects/cm2

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a. find the yield for both wafers.

b. find the cost per good die for both wafers.

c. if the number of dies per wafer is increased by 10% and the defects per area unit increases by 15% find the die area and yield.

d. assume a fabrication process improves the yield from 0.92 to 0.95. find the defects per area

unit for each version of the technology given a die area of 200 mm2

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Assume a 15 cm diameter wafer has a cost of 12, contains 84 dies, and has 0.020 defects/cm2
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